Interchangeable eyepiece with 40x magnification for NA2 and NAK2 levels - Leica FOK73

In precise levelling the limit is rarely the compensator, it is the observer's eye on the staff graduation. The Leica FOK73 attacks exactly that point, it replaces the standard eyepiece of the NA2 and NAK2 levels and raises magnification from 32x to 40x. The graduation lines appear correspondingly larger, estimation becomes safer, and that matters most at the longer sight distances where readings degrade first.

Benefits

• 40x instead of 32x magnification, a gain of one quarter that translates straight into how well the staff graduation can be read.
• Safer estimation on the parallel plate micrometer, because scale and staff lines separate more clearly in the magnified image.
• Longer usable sight distances, the levelling line needs fewer instrument stations, and every change point saved is one error source less.
• Existing instruments stay in service, the eyepiece upgrades an NA2 or NAK2 already in the kit instead of forcing a new purchase.
• Professional fitting by a Leica Geosystems service centre, where the instrument is checked and handed back adjusted.

Technical data

Applications

Precise levelling with an invar staff, settlement and deformation measurements on structures, height monitoring of track, bridges and machine foundations, industrial alignment work over long sight distances. Anywhere the last tenth of the reading counts.

Compatibility and scope of delivery

The FOK73 is intended for the Leica NA2 and NAK2 precise levels and takes the place of the standard eyepiece. It combines with the Leica GPM3 parallel plate micrometer (material number 356121), which brings readings to 0.1 mm with estimation to 0.01 mm. The eyepiece is supplied on its own, fitting into the instrument is done by a Leica Geosystems service centre and is not part of the delivery.

Origin

Original accessory from Leica Geosystems, material number 346475.