EM Eye multifunction meter for ESD events - SCS 770715

The EM Eye Meter detects, counts and measures ESD events that can cause failures in sensitive components. It calculates the event magnitude for the Charged Device Model (CDM), the Human Body Model (HBM) and the Machine Model (MM). All measurements are recorded on a microSD card and can be loaded onto any PC for further processing or archiving. The touchscreen display makes the unit simple and intuitive to operate; with optional attachments it becomes a portable detector for ESD discharges and electromagnetic fields.

Key benefits

• ESD event meter that detects, counts and measures discharges before they cause tool lock-ups or parametric failures
• Selectable ESD event models: event magnitude calculation for CDM, HBM and MM
• microSD card memory for gap-free recording and PC download of all measurements
• Touchscreen display for an intuitive user interface
• Power slide switch saves the rechargeable lithium-ion battery during storage
• Expandable to a detector for electromagnetic and RF fields via optional sensors

Technical data

• Audio indicators: speaker, beep or analogue audio with volume control
• Recording interval: peaks 1 to 360 s, averages 0.1 to 360 s
• Display: touchscreen monitor 32 x 105 mm
• External memory: microSD card
• Headphone connection: 3.5 mm jack
• Charger: 100 to 240 V, 50 to 60 Hz, 5 V DC / 1000 mA
• ESD event sensor: input resolution 1 mV (1 to 15 mV); 15 mV (15 to 1500 mV)
• ESD event sensor: range 1.3 cm to 38.1 cm
• EM field sensor: calibration frequency 1 GHz, antenna factor -40.0 to 40 dBm
• RF signal sensor: dynamic range -55 dBm (min) to 0 dBm (max), attenuation 0 dB / 20 dB

Scope of supply

• EM Eye Meter multifunction meter
• ESD event sensor (EP0201035)
• microSD card 4 GB and microSD-to-USB adapter
• Power adapter 5 V DC with interchangeable plugs
• Local antenna and CTC113 remote antenna with RF cable
• Sturdy aluminium case, calibration certificate

Applications

• Locating and quantifying ESD events in production lines
• Root cause analysis of tool lock-ups and parametric failures
• Detection of electromagnetic and RF fields with optional sensors

Standards and compliance

Supports ESD event assessment using the CDM, HBM and MM models within ESD control programmes to IEC 61340 and ANSI/ESD S20.20. NIST-traceable calibration.